半導体薄膜の励起子観測と試料評価のためのブリュスター角反射分光法

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Material Type: 図書
Title: 半導体薄膜の励起子観測と試料評価のためのブリュスター角反射分光法
Author/Editor: 黒田, 隆
Kuroda, Takashi
Author Heading: 黒田, 隆
Kuroda, Takashi
Publication, Distribution, etc.: 固体物理
Publication Date: 1994
Publication Date (W3CDTF): 1994
Periodical title: 固体物理
No. or year of volume/issue: 29 9
Volume: 29
Issue: 9
Pages: 753-758
Text Language Code: jpn
Target Audience: 一般
Note (General): identifier:oai:t2r2.star.titech.ac.jp:00046208
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 東京工業大学 : 東京工業大学リサーチリポジトリ