X線光電子分光法による酸化物ガラス中のO1s電子の状態の解析

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Material Type: 博士論文
Title: X線光電子分光法による酸化物ガラス中のO1s電子の状態の解析
Author/Editor: 瀬川, 浩代
Segawa, Hiroyo
Author Heading: 瀬川, 浩代
Segawa, Hiroyo
Publication Date: 2000-02
Publication Date (W3CDTF): 2000-02
Degree grantor/type: 東京工業大学
Date Granted: 2000-03-26
Dissertation Number: A4306
Degree Type: 工学博士
Text Language Code: jpn
Target Audience: 一般
Note (General): identifier:oai:t2r2.star.titech.ac.jp:99004482
Format (IMT): application/pdf
Source: fulltext
http://t2r2.star.titech.ac.jp/rrws/file/CTT100595542/ATD100000413/116755491.pdf
Access Restrictions: インターネット公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 東京工業大学 : 東京工業大学リサーチリポジトリ