A thru-only de-embedding method for on-wafer characterization of multiport networks

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Material Type: 図書
Title: A thru-only de-embedding method for on-wafer characterization of multiport networks
Author/Editor: 天川, 修平
Amakawa, Shuhei
石原, 昇
Ishihara, Noboru
益, 一哉
Masu, Kazuya
Author Heading: 天川, 修平
Amakawa, Shuhei
石原, 昇
Ishihara, Noboru
益, 一哉
Masu, Kazuya
Publication, Distribution, etc.: InTech
Publication Date: 2010-04
Publication Date (W3CDTF): 2010-04
Periodical title: Advanced Microwave Circuits and Systems
Pages: 13-32
Text Language Code: eng
Target Audience: 一般
Note (General): identifier:oai:t2r2.star.titech.ac.jp:50133754
Format (IMT): application/pdf
Source: http://t2r2.star.titech.ac.jp/rrws/file/CTT100619116/ATD100000413/a_thru-only_de-embedding_method_foron-wafer_characterization_of_multiport_networks secured.pdf
http://t2r2.star.titech.ac.jp/rrws/file/CTT100619116/ATD100000413/a_thru-only_de-embedding_method_foron-wafer_characterization_of_multiport_networks%20secured.pdf
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 東京工業大学 : 東京工業大学リサーチリポジトリ