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文書・図像類

NDIS 2430:2017 半導体製造用高圧ガス容器の超音波探傷検査による再検査方法

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NDIS 2430:2017 半導体製造用高圧ガス容器の超音波探傷検査による再検査方法

Material type
文書・図像類
Author
井上, 裕嗣ほか
Publisher
日本非破壊検査協会
Publication date
2018-01
Material Format
Paper
Capacity, size, etc.
-
NDC
-
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Notes on use

Note (General)：

identifier:oai:t2r2.star.titech.ac.jp:50438494

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Paper

Material Type
文書・図像類
Title
NDIS 2430:2017 半導体製造用高圧ガス容器の超音波探傷検査による再検査方法
Author/Editor
井上, 裕嗣
INOUE, HIROTSUGU
Author Heading
井上, 裕嗣
INOUE, HIROTSUGU
Publication, Distribution, etc.
日本非破壊検査協会
Publication Date
2018-01
Publication Date (W3CDTF)
2018-01
Text Language Code
jpn
Target Audience
一般
Note (General)
identifier:oai:t2r2.star.titech.ac.jp:50438494