非破壊検査（AE試験）へのAI適用

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Material Type: 図書
Title: 非破壊検査（AE試験）へのAI適用
Author/Editor: 水谷, 義弘
mizutani, yoshihiro
Author Heading: 水谷, 義弘
mizutani, yoshihiro
Publication, Distribution, etc.: テクノシステム
Publication Date: 2020-02
Publication Date (W3CDTF): 2020-02
Periodical title: IoT・AIを利用したヘルスモニタリング
Pages: 75-91
Text Language Code: jpn
Target Audience: 一般
Note (General): identifier:oai:t2r2.star.titech.ac.jp:50560114
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 東京工業大学 : 東京工業大学リサーチリポジトリ