Study on thermal instability of thin SOI layers for application to quantum dot devices

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Study on thermal instability of thin SOI layers for application to quantum dot devices

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000004220247

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Material Type: 文書・図像類
Title: Study on thermal instability of thin SOI layers for application to quantum dot devices
Author/Editor: Nuryadi, Ratno
Author Heading: Nuryadi, Ratno
Publication, Distribution, etc.: 静岡大学大学院電子科学研究科
Publication Date: 2004-03-08
Publication Date (W3CDTF): 2004-03-08
Alternative Title: 薄いSOI層の熱的不安定性の解明と量子ドットデバイスへの応用
Periodical title: 静岡大学大学院電子科学研究科研究報告
No. or year of volume/issue: 25
Volume: 25
Pages: 138-140
ISSN (Periodical Title): PISSN : 03885070
Text Language Code: eng
NDC: 541
Target Audience: 一般
Note (General): 博士学位論文の要旨学位記番号:工博甲第239号
甲第328号
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Access Restrictions: インターネット公開
Related Material: 000004220247
Periodical Title (NCID): AN00103168
https://ci.nii.ac.jp/ncid/AN00103168
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 静岡大学 : 静岡大学学術リポジトリ