Beam alignment of scanning microbeam PIXE analysis system in NIRS

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Summary, etc.：: The scanning microbeam PIXE (Particle Induced X-ray Emission) analysis allows identifying the several surface elements and taking the high-resolution ...

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Material Type: 文書・図像類
Title: Beam alignment of scanning microbeam PIXE analysis system in NIRS
Author/Editor: Imaseki, Hitoshi
今関等
Author Heading: Imaseki, Hitoshi
今関等
Publication Date: 2003-03-14
Publication Date (W3CDTF): 2003-03-14
Text Language Code: eng
Target Audience: 一般
Note (General): Workshop on Accelerator Operation(WAO) 2003
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 国立研究開発法人量子科学技術研究開発機構 : 量子科学技術研究開発機構学術機関リポジトリ