The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe

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Summary, etc.：: We have improved a soft x-ray laser interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot image of the nano-scaled str...

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Material Type: 文書・図像類
Title: The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe
Author/Editor: 長谷川, 登
錦野
石野, 雅彦
大西直史
伊藤篤史
南康夫
馬場基芳
Faenov, A.Y.
Inogamov, N.
河内, 哲哉
末元徹
長谷川登
錦野将元
石野雅彦
河内哲哉
Author Heading: 長谷川, 登
錦野
石野, 雅彦
大西直史
伊藤篤史
南康夫
馬場基芳
Faenov, A.Y.
Inogamov, N.
河内, 哲哉
末元徹
長谷川登
錦野将元
石野雅彦
河内哲哉
Publication Date: 2016-05-24
Publication Date (W3CDTF): 2016-05-24
Text Language Code: eng
Target Audience: 一般
Note (General): The 15th International Conference on X-Ray Lasers
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 国立研究開発法人量子科学技術研究開発機構 : 量子科学技術研究開発機構学術機関リポジトリ