文書・図像類

Differential processing of low and high LET radiation induced DNA damage: Investigation of switch from ATM to ATR signaling(15J386)

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Differential processing of low and high LET radiation induced DNA damage: Investigation of switch from ATM to ATR signaling(15J386)

Material type
文書・図像類
Author
XUE, Lianほか
Publisher
-
Publication date
2017-04-17
Material Format
Paper
Capacity, size, etc.
-
NDC
-
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H28年度HIMAC共同利用研究成果発表会

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Paper

Material Type
文書・図像類
Author/Editor
XUE, Lian
Yu, Dong
Yajima, Hirohiko
Furusawa, Yoshiya
Liu, Cuihua
Fujimori, Akira
Wang, Bing
薛 蓮
于 冬
矢島 浩彦
古澤 佳也
劉 翠華
藤森 亮
王 冰
Publication Date
2017-04-17
Publication Date (W3CDTF)
2017-04-17
Text Language Code
eng
Target Audience
一般
Note (General)
H28年度HIMAC共同利用研究成果発表会
Data Provider (Database)
国立情報学研究所 : 学術機関リポジトリデータベース(IRDB)(機関リポジトリ)