VUV waveform characterization by reflectivity depletion in laser ablation of Si

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Summary, etc.：: 極短パルスレーザーをシリコンに集光することによってレーザーアブレーションを起こし、波長132 nm の真空紫外プローブパルスの時間分解反射スペクトルを測定した。アブレーションによる反射スペクトルの減衰に対してFROG解析行い、真空紫外パルスのパルス幅を 16 fs と決定し、スペクトル位相も決定した...

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Material Type: 文書・図像類
Title: VUV waveform characterization by reflectivity depletion in laser ablation of Si
Author/Editor: Itakura, Ryuji
Akagi, Hiroshi
Otobe, Tomohito
Author Heading: Itakura, Ryuji
Akagi, Hiroshi
Otobe, Tomohito
Itakura, Ryuji
Akagi, Hiroshi
Otobe, Tomohito
Publication Date: 2019-06-05
Publication Date (W3CDTF): 2019-06-05
Text Language Code: eng
Target Audience: 一般
Note (General): 35th Symposium on Chemical Kinetics and Dynamics
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 国立研究開発法人量子科学技術研究開発機構 : 量子科学技術研究開発機構学術機関リポジトリ