Instruction-based self-testing of performance oriented faults in modern processors

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Material Type: 博士論文
Title: Instruction-based self-testing of performance oriented faults in modern processors
Author/Editor: Singh, Virendra
Author Heading: Singh, Virendra
Publication, Distribution, etc.: Nara Institute of Science and Technology
Publication Date: 2005-09-30
Publication Date (W3CDTF): 2005-09-30
Alternative Title: 高性能プロセッサにおける性能関連故障に対する命令レベル自己テスト
コウセイノウプロセッサニオケルセイノウカンレンコショウニタイスルメイレイレベルジコテスト
Degree grantor/type: 奈良先端科学技術大学院大学
Date Granted: 2005-09-30
Dissertation Number: 甲第521号
Degree Type: 博士(工学)
Text Language Code: eng
Subject Heading: Microprocessor testing
VLSI testing
at-speed testing
Performance oriented faults
delay fault testing
instruction-based self-testing
Target Audience: 一般
DOI: 10.34413/dr.00521
Format (IMT): application/pdf
Source: fulltext （fulltext）
https://naist.repo.nii.ac.jp/record/10292/files/R003806.pdf
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar