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博士論文

Studies on design for delay testability and over-testing reduction for delay faults

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Studies on design for delay testability and over-testing reduction for delay faults

Material type
博士論文
Author
吉川, 祐樹
Publisher
Nara Institute of Science and Technology
Publication date
2007-03-23
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
奈良先端科学技術大学院大学,博士(工学)
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    Digital
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    naistar : NAIST Academic Repository

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Digital

Material Type
博士論文
Title
Studies on design for delay testability and over-testing reduction for delay faults
Author/Editor
吉川, 祐樹
Author Heading
吉川, 祐樹 ヨシカワ, ユウキ
https://kaken.nii.ac.jp/ja/search/?qm=30807483Leave the NDL website.
Publication, Distribution, etc.
Nara Institute of Science and Technology
Publication Date
2007-03-23
Publication Date (W3CDTF)
2007-03-23
Alternative Title
遅延テスト容易化設計ならびに遅延故障に対する過剰テストの緩和に関する研究
チエン テスト ヨウイカ セッケイ ナラビニ チエン コショウ ニ タイスル カジョウ テスト ノ カンワ ニカンスル ケンキュウ
Degree grantor/type
奈良先端科学技術大学院大学
Date Granted
2007-03-23