Sequential test generation based on circuit pseudo-transformation

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Summary, etc.：: The test generation problem for a sequential circuit capable of generating tests with combinational test generation complexity can be reduced to that ...

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Material Type: 文書・図像類
Title: Sequential test generation based on circuit pseudo-transformation
Author/Editor: Ohtake, Satoshi
Inoue, Tomoo
Fujiwara, Hideo
Author Heading: Ohtake, Satoshi
Inoue, Tomoo
Fujiwara, Hideo
Publication, Distribution, etc.: Nara Institute of Science and Technology
Publication Date: 1997-07
Publication Date (W3CDTF): 1997-07
Periodical title: Information Science Technical Report
No. or year of volume/issue: TR97014
Issue: TR97014
ISSN (Periodical Title): ISSN : 0919-9527
Text Language Code: eng
Target Audience: 一般
Format (IMT): application/pdf
Source: fulltext （fulltext）
https://naist.repo.nii.ac.jp/record/8785/files/R000653.pdf
Access Restrictions: インターネット公開
Periodical Title: URI
http://isw3.naist.jp/IS/TechReport/
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar