Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation

• Material Type: 文書・図像類
• Title: Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation
• Author/Editor: Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo
• Author Heading: Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo
• Publication, Distribution, etc.: Nara Institute of Science and Technology
• Publication Date: 2004-12
• Publication Date (W3CDTF): 2004-12
• Periodical title: Information Science Technical Report
• No. or year of volume/issue: TR2004009
• Issue: TR2004009
• ISSN (Periodical Title): ISSN : 0919-9527
• Text Language Code: eng
• Target Audience: 一般
• Format (IMT): application/pdf
• Source: fulltext （fulltext）; https://naist.repo.nii.ac.jp/record/8843/files/R003223.pdf
• Access Restrictions: インターネット公開
• Periodical Title: URI; http://isw3.naist.jp/IS/TechReport/
• Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）; https://irdb.nii.ac.jp
• Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar

• Summary, etc.: This paper presents a transition test generation method for acyclic sequential circuits. In this method, to generate test sequences for transition fau...