Classification of sequential circuits based on combinational test generation complexity

Digital data available（奈良先端科学技術大学院大学学術リポジトリnaistar）

学術機関リポジトリデータベース（IRDB）（機関リポジトリ）

Classification of sequential circuits based on combinational test generation complexity

Detailed bibliographic record

Summary, etc.：: Several classes of sequential circuits with combinational test generation complexity have been introduced. However, no general notation is used to def...

Search by Bookstore

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

naistar : NAIST Academic Repository
Digital
You can check the holdings of institutions and databases with which Institutional Repositories DataBase(IRDB)(Institutional Repository) is linked at the site of Institutional Repositories DataBase(IRDB)(Institutional Repository).
naistar : NAIST Academic Repository

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 文書・図像類
Title: Classification of sequential circuits based on combinational test generation complexity
Author/Editor: Ooi, Chia Yee
Fujiwara, Hideo
Author Heading: Ooi, Chia Yee
Fujiwara, Hideo
Publication, Distribution, etc.: Nara Institute of Science and Technology
Publication Date: 2004-01
Publication Date (W3CDTF): 2004-01
Periodical title: Information Science Technical Report
No. or year of volume/issue: TR2004001
Issue: TR2004001
ISSN (Periodical Title): ISSN : 0919-9527
Text Language Code: eng
Target Audience: 一般
Access Restrictions: インターネット公開
Periodical Title (URI): URI
http://isw3.naist.jp/IS/TechReport/
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar