An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency

• Material Type: 文書・図像類
• Title: An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency
• Author/Editor: Ohtake, Satoshi; Nagai, Shintaro; Wada, Hiroki; Fujiwara, Hideo
• Author Heading: Ohtake, Satoshi; Nagai, Shintaro; Wada, Hiroki; Fujiwara, Hideo
• Publication, Distribution, etc.: Nara Institute of Science and Technology
• Publication Date: 2000-11
• Publication Date (W3CDTF): 2000-11
• Periodical title: Information Science Technical Report
• No. or year of volume/issue: TR2000009
• Issue: TR2000009
• ISSN (Periodical Title): ISSN : 0919-9527
• Text Language Code: eng
• Target Audience: 一般
• Access Restrictions: インターネット公開
• Periodical Title (URI): URI; http://isw3.naist.jp/IS/TechReport/
• Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）; https://irdb.nii.ac.jp
• Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar

• Summary, etc.: This paper proposes a non-scan design-for-test-ability method for register-transfer level circuits where a cir-cuit consists of a controller and a dat...