A new class of sequential circuits with acyclic test generation complexity

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Summary, etc.：: This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequ...

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Material Type: 文書・図像類
Title: A new class of sequential circuits with acyclic test generation complexity
Author/Editor: Ooi, Chia Yee
Fujiwara, Hideo
Author Heading: Ooi, Chia Yee
Fujiwara, Hideo
Publication, Distribution, etc.: Nara Institute of Science and Technology
Publication Date: 2006-05
Publication Date (W3CDTF): 2006-05
Periodical title: Information Science Technical Report
No. or year of volume/issue: TR2006003
Issue: TR2006003
ISSN (Periodical Title): ISSN : 0919-9527
Text Language Code: eng
Target Audience: 一般
Access Restrictions: インターネット公開
Periodical Title (URI): URI
http://isw3.naist.jp/IS/TechReport/
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar