An approach to reduce over-testing of path delay faults in data paths using RT-level information

• Material Type: 文書・図像類
• Title: An approach to reduce over-testing of path delay faults in data paths using RT-level information
• Author/Editor: Yoshikawa, Yuki; Ohtake, Satoshi; Fujiwara, Hideo
• Author Heading: Yoshikawa, Yuki; https://kaken.nii.ac.jp/ja/search/?qm=30807483; Ohtake, Satoshi; Fujiwara, Hideo
• Publication, Distribution, etc.: Nara Institute of Science and Technology
• Publication Date: 2006-02
• Publication Date (W3CDTF): 2006-02
• Periodical title: Information Science Technical Report
• No. or year of volume/issue: TR2006001
• Issue: TR2006001
• ISSN (Periodical Title): ISSN : 0919-9527
• Text Language Code: eng
• Target Audience: 一般
• Access Restrictions: インターネット公開
• Periodical Title (URI): URI; http://isw3.naist.jp/IS/TechReport/
• Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）; https://irdb.nii.ac.jp
• Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar

• Summary, etc.: In this paper, we present an approach to reduce overtesting of path delay faults (PDFs). To reduce test generation complexity, design-for-testability ...