Development and Applications of Tip-Scan High-Speed Atomic Force Microscopy Combined with Substrate Stretching Device

Digital data available（名古屋大学学術機関リポジトリ）

学術機関リポジトリデータベース（IRDB）（機関リポジトリ）

Development and Applications of Tip-Scan High-Speed Atomic Force Microscopy Combined with Substrate Stretching Device

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Material Type: 博士論文
Title: Development and Applications of Tip-Scan High-Speed Atomic Force Microscopy Combined with Substrate Stretching Device
Author/Editor: 詹, 豐嶽
Author Heading: 詹, 豐嶽
Publication Date: 2023-03-27
Publication Date (W3CDTF): 2023-03-27
Alternative Title: 基板の一軸伸張機構を有する探針走査型高速原子間力顕微鏡の開発
Degree grantor/type: 名古屋大学
Date Granted: 2023-03-27
Dissertation Number: 甲第14410号
Degree Type: 博士(理学)
Text Language Code: eng
Target Audience: 一般
Format (IMT): application/pdf
Source: fulltext
https://nagoya.repo.nii.ac.jp/record/2005658/files/k14410_thesis.pdf
Access Restrictions: インターネット公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 名古屋大学 : 名古屋大学学術機関リポジトリ