Evaluation of Transition Untestable Faults Using a Multi-Cycle Capture Test Generation Method
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Bibliographic Record
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- Material Type
- 文書・図像類
- Author/Editor
- 吉村, 正義小河, 宏志細川, 利典山崎, 浩二
- Publication, Distribution, etc.
- Publication Date
- 2010-04
- Publication Date (W3CDTF)
- 2010-04
- Periodical title
- Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
- Pages
- 273-276
- Text Language Code
- eng