Analysis of Scars and Keloids by Focused Ion Beam/Scanning Electron Microscopy: Distinguishing Between Hypertrophic Scars and Keloids

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Analysis of Scars and Keloids by Focused Ion Beam/Scanning Electron Microscopy: Distinguishing Between Hypertrophic Scars and Keloids

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Annals of plastic surgery 84(4):379-384, 2020

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Material Type: 博士論文
Title: Analysis of Scars and Keloids by Focused Ion Beam/Scanning Electron Microscopy: Distinguishing Between Hypertrophic Scars and Keloids
Author/Editor: 右田, 尚
Author Heading: 右田, 尚ミギタ, ヒサシ
Alternative Title: 集束イオンビーム観察装置付走査型電子顕微鏡を用いた瘢痕およびケロイドの解析―肥厚性瘢痕とケロイドの鑑別―
Degree grantor/type: 久留米大学
Date Granted: 2020-04-01
Dissertation Number: 乙第2966号
Degree Type: 博士（医学）
Text Language Code: eng
Subject Heading: cell-cell interaction
focused ion beam/scanning electron microscopic tomography
hypertrophic scar
intercellular contact
keloid
Target Audience: 一般
Note (General): 2020年度
Format (IMT): application/pdf
Access Restrictions: インターネット公開
Is Version Of: Annals of plastic surgery 84(4):379-384, 2020
Is Version Of (DOI): 10.1097/SAP.0000000000002231
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 久留米大学 : 久留米大学機関リポジトリ