Study on density of states in In-X-Zn-O (X=Sn, Ga) semiconductors and defect passivation methods for highly reliable thin-film transistors

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Study on density of states in In-X-Zn-O (X=Sn, Ga) semiconductors and defect passivation methods for highly reliable thin-film transistors

Material type: 博士論文

Author: JIANG, Jingxin

Publisher: 高知工科大学

Publication date: 2015-03

Material Format: Digital

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Name of awarding university/degree: 高知工科大学,博士（工学）

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Note (General)：: identifier:高知工科大学, 博士論文.

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Material Type: 博士論文
Title: Study on density of states in In-X-Zn-O (X=Sn, Ga) semiconductors and defect passivation methods for highly reliable thin-film transistors
Author/Editor: JIANG, Jingxin
Author Heading: JIANG, Jingxin
Publication, Distribution, etc.: 高知工科大学
Publication Date: 2015-03
Publication Date (W3CDTF): 2015-03
Alternative Title: n-Ga-Zn-O酸化物半導体の欠陥準位が電気特性に及ぼす影響と欠陥不活性化プロセスによる薄膜トランジスタの高信頼性化に関する研究
Contributor: 古田　守
Degree grantor/type: 高知工科大学
Date Granted: 2015-03-20
Dissertation Number: 甲第272号
Degree Type: 博士（工学）
Text Language Code: eng
Target Audience: 一般
Note (General): identifier:高知工科大学, 博士論文.
Source: fulltext
https://kutarr.kochi-tech.ac.jp/?action=repository_action_common_download&item_id=573&item_no=1&attribute_id=19&file_no=1
fulltext
https://kutarr.kochi-tech.ac.jp/?action=repository_action_common_download&item_id=573&item_no=1&attribute_id=19&file_no=2
fulltext
https://kutarr.kochi-tech.ac.jp/?action=repository_action_common_download&item_id=573&item_no=1&attribute_id=19&file_no=3
Access Restrictions: インターネット公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 高知工科大学 : 高知工科大学学術情報リポジトリ