Defect-oriented Built-In Self-Test for Analog Mixed-Signal Circuits

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Material Type: 博士論文
Title: Defect-oriented Built-In Self-Test for Analog Mixed-Signal Circuits
Author/Editor: TANG Xiaobin
Author Heading: TANG Xiaobin
Degree grantor/type: 高知工科大学
Date Granted: 2023-09-20
Text Language Code: eng
Target Audience: 一般
DOI: 10.32149/0002000021
Format (IMT): application/pdf
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 高知工科大学 : 高知工科大学学術情報リポジトリ