SiC Technologies for High Reliability

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Note (General)：: 第25回マイクロエレクトロニクスワークショップ(MEWS25) (2012年11月1日-2日. つくば国際会議場), つくば市, 茨城The 25th Microelectronics Workshop (MEWS25) (Nobember 1-2, 2012. Tsukuba Internatio...

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https://eeepitnl.tksc.jaxa.jp/MEWS/EN/25th/presentation-e.htm

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Material Type: 文書・図像類
Title: SiC Technologies for High Reliability
Author/Editor: Coello, Agustin
Godignon, Philippe
Author Heading: Coello, Agustin
Godignon, Philippe
Publication, Distribution, etc.: 宇宙航空研究開発機構研究開発本部電子部品・デバイス・材料グループ(JAXA)
Publication Date: 2012-11-01
Publication Date (W3CDTF): 2012-11-01
Pages: 1-29
Text Language Code: eng
Target Audience: 一般
Note (General): 第25回マイクロエレクトロニクスワークショップ(MEWS25) (2012年11月1日-2日. つくば国際会議場), つくば市, 茨城
The 25th Microelectronics Workshop (MEWS25) (Nobember 1-2, 2012. Tsukuba International Congress Center), Tsukuba, Ibaraki, Japan
形態: カラー図版あり
Physical characteristics: Original contains color illustrations
資料番号: AD1710000012
Related Material: https://eeepitnl.tksc.jaxa.jp/MEWS/EN/25th/presentation-e.htm
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 宇宙航空研究開発機構 : 宇宙航空研究開発機構リポジトリ