文書・図像類

On accrual failure detectors

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On accrual failure detectors

Material type
文書・図像類
Author
Defago, Xavierほか
Publisher
北陸先端科学技術大学院大学情報科学研究科
Publication date
2004-05-14
Material Format
Digital
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Notes on use

Note (General):

Traditionally, failure detectors have considered a binary model whereby a given process can be either trusted or suspected. This paper defines a famil...

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Digital

Material Type
文書・図像類
Author/Editor
Defago, Xavier
Urban, Peter
Hayashibara, Naohiro
Katayama, Takuya
Publication Date
2004-05-14
Publication Date (W3CDTF)
2004-05-14
Periodical title
Research report (School of Information Science, Japan Advanced Institute of Science and Technology)
No. or year of volume/issue
IS-RR-2004-011
Volume
IS-RR-2004-011