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Table of Contents
Abstract / p2 Contents / p4 1 Introduction / p1 1.1 Negative Differential Conductivity(NDC) / p2 1.2 Gunn effect / p3 1.3 Gunn effect with impact ionization / p6 1.4 Recombination instability / p7 1.5 Chaos in semiconductors / p8 1.6 Composition of following chapters / p9 2 Chaotic current oscillations in the Gunn-effect device under the dc and the rf bias voltages / p13 2.1 Introduction / p13 2.2 Equations of motion and the method of solution / p14 2.3 The motion under the dc bias voltage / p18 2.4 The motion under the dc and rf bias voltage / p20 3 Non-periodic current oscillations in the Gunn-effect device with the impact-ionization effect / p33 3.1 Introduction / p33 3.2 Equations of motion and the method of solution / p34 3.3 Simulational results / p38 4 Current oscillations induced by recombination instability in semiconductors / p49 4.1 Introduction / p49 4.2 Equations of motion and simulation method / p49 4.3 Simulational results / p54 5 Summary and conclusion / p71
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Bibliographic Record
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- Material Type
- 博士論文
- Title
- Author/Editor
- 生塩, 研一
- Author Heading
- Alternative Title
- Current Oscillations and Domain Instability in Semiconductors
- Degree grantor/type
- 広島大学
- Date Granted
- 1996-03-26
- Dissertation Number
- 甲第1436号
- Degree Type
- 博士(理学)Physical Science
- Text Language Code
- eng