Small Delay Testing Using On-chip Delay Measurement

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Material Type: 博士論文
Title: Small Delay Testing Using On-chip Delay Measurement
Author/Editor: 張, 文坡
Author Heading: 張, 文坡
Publication, Distribution, etc.: 千葉大学
Alternative Title: オンチップ遅延測定を用いた微小遅延テスト
Contributor: 千葉大学大学院融合科学研究科
Degree grantor/type: 千葉大学
Date Granted: 2015-03-25
Dissertation Number: 甲第5391号
Degree Type: 博士(工学)
Text Language Code: eng
Target Audience: 一般
Note (General): type:text
研究科: 千葉大学大学院融合科学研究科
学位:千大院融博甲第工48号
Format (IMT): application/pdf
Source: fulltext
https://opac.ll.chiba-u.jp/da/curator/900119194/YLA_0048.pdf
Access Restrictions: インターネット公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 千葉大学 : 千葉大学学術成果リポジトリ