パーソナルコンピュータを用いた半導体中トラップの評価システムの製作

Material type: 文書・図像類

Author: 徳田, 豊ほか

Publisher: 愛知工業大学

Publication date: 1992-03-31

Material Format: Digital

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Note (General)：: Evaluation system of deep traps in pn and Schottky junctions, and MOS structures was developed by using personal computer. Deep level transient spectr...

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Material Type: 文書・図像類
Title: パーソナルコンピュータを用いた半導体中トラップの評価システムの製作
Author/Editor: 徳田, 豊
下方, 稔久
Author Heading: 徳田, 豊
下方, 稔久
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 1992-03-31
Publication Date (W3CDTF): 1992-03-31
Alternative Title: パーソナルコンピュータオモチイタハンドウタイチュウトラップノヒョウカシステムノセイサク
Development of Evaluation System of Deep Traps in Semiconductors by Using Personal Computer
Periodical title: 愛知工業大学研究報告. B, 専門関係論文集 = Bulletin of Aichi Institute of Technology. Part B
No. or year of volume/issue: 27
Volume: 27
Pages: 23-29
ISSN (Periodical Title): ISSN : 0387-0812
Text Language Code: jpn
Target Audience: 一般
Note (General): Evaluation system of deep traps in pn and Schottky junctions, and MOS structures was developed by using personal computer. Deep level transient spectroscopy and weighted capacitance transient spectroscopy measurements are made by using this system. Zerbst and Schroder analyses are also performed for MOS structures. This simple measurement system can provide useful technique to detect traps in semiconductors.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/893
Access Restrictions: 限定公開
Periodical Title (NCID): AN00007801
https://ci.nii.ac.jp/ncid/AN00007801
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ