光音響効果を用いた内部欠陥検出の自動化に関する研究

Material type: 文書・図像類

Author: 大江, 貴之ほか

Publisher: 愛知工業大学

Publication date: 2008-03-31

Material Format: Digital

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Note (General)：: A non-contact and non destractive internal defect could be detected by a low power semiconductor laser and a ultrasonic sensor using a photoacoustic e...

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Material Type: 文書・図像類
Title: 光音響効果を用いた内部欠陥検出の自動化に関する研究
Author/Editor: 大江, 貴之
名和, 靖彦
津田, 紀生
山田, 諄
Author Heading: 大江, 貴之
名和, 靖彦
津田, 紀生
山田, 諄
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 2008-03-31
Publication Date (W3CDTF): 2008-03-31
Alternative Title: ヒカリ　オンキョウ　コウカ　ヲ　モチイタ　ナイブ　ケッカン　ケンシュツ　ノ　ジドウカ　ニ　カンスル　ケンキュウ
Study on automation of internal defect detection by photoacoustic effect
Periodical title: 愛知工業大学研究報告 = Bulletin of Aichi Institute of Technology
No. or year of volume/issue: 43
Volume: 43
Pages: 23-28
ISSN (Periodical Title): ISSN : 1883-3217
Text Language Code: jpn
Target Audience: 一般
Note (General): A non-contact and non destractive internal defect could be detected by a low power semiconductor laser and a ultrasonic sensor using a photoacoustic effect. But the sensitivity of the ultrasonic sensor is low for detecting the photoacoustic signal. To detect the photoacoustic signal, a self-coupling effect of another semiconductor laser was used. The self-coupling sensor has high spatial resolution in comparison with the ultrasonic sensor. It takes a lot of time to detect detail defect profile manually. Then an automatic of internal defect detection by photoacoustic effect has been studied, in which X-Y auto stage and oscilloscope are connected to personal computer. It is found that by automatic measurement in defect detection the detective sensitivity becomes to be high and the processing time becomes to be short.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/1391
Format (IMT): application/pdf
Source: http://repository.aitech.ac.jp/dspace/bitstream/11133/1391/1/%e7%b4%80%e8%a6%8143%e5%8f%b7%28P23-28%29.pdf
http://repository.aitech.ac.jp/dspace/bitstream/11133/1391/1/%e7%b4%80%e8%a6%8143%e5%8f%b7%28P23-28%29.pdf
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ