ナノ及び原子的尺度における微構造の変化の電子顕微鏡による解析

Material type: 文書・図像類

Author: 井村, 徹ほか

Publisher: 愛知工業大学

Publication date: 1999-06-30

Material Format: Digital

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Note (General)：: Notable advancement of EM techniques has been made in recent years particularly in the field of analysis of atomistic processes of dynamic phenomena. ...

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Material Type: 文書・図像類
Title: ナノ及び原子的尺度における微構造の変化の電子顕微鏡による解析
Author/Editor: 井村, 徹
高木, 誠
岩田, 博之
Author Heading: 井村, 徹
高木, 誠
岩田, 博之
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 1999-06-30
Publication Date (W3CDTF): 1999-06-30
Alternative Title: ナノオヨビゲンシテキシャクドニオケルビコウゾウノヘンカノデンシケンビキョウニヨルカイセキ
EM Analyses for the Change of Microstructures in Nano and Atomic Scales
Periodical title: 総合技術研究所研究報告=Bulletin of Research Institute for Industrial Technology.
No. or year of volume/issue: 1
Volume: 1
Pages: 7-10
ISSN (Periodical Title): ISSN : 1344-9672
Text Language Code: jpn
Target Audience: 一般
Note (General): Notable advancement of EM techniques has been made in recent years particularly in the field of analysis of atomistic processes of dynamic phenomena. In this note, some applications of those advanced techniques to the studies of deformation, ion-irradiation induced fracture and crystal growth are to be illustrated and reviewed briefly.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/1560
Access Restrictions: 限定公開
Periodical Title (NCID): AA11484797
https://ci.nii.ac.jp/ncid/AA11484797
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ