引き上げ法によるカーボンナノチューブ探針の簡易作製

Material type: 文書・図像類

Author: 松室, 昭仁ほか

Publisher: 愛知工業大学

Publication date: 2007-08-31

Material Format: Digital

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Note (General)：: Carbon nanotubes (CNT) are just beginning to be used as probes for scanning probe microscope (SPM) systems because of the extreme high resolution that...

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Material Type: 文書・図像類
Title: 引き上げ法によるカーボンナノチューブ探針の簡易作製
Author/Editor: 松室, 昭仁
高木, 誠
岩田, 博之
松本, 章宏
間野, 日出男
Author Heading: 松室, 昭仁
高木, 誠
岩田, 博之
松本, 章宏
間野, 日出男
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 2007-08-31
Publication Date (W3CDTF): 2007-08-31
Alternative Title: Process of Carbon Nanotube Probe by Pulling Method
Periodical title: 総合技術研究所研究報告=Bulletin of Research Institute for Industrial Technology.
No. or year of volume/issue: 9
Volume: 9
Pages: 101-106
ISSN (Periodical Title): ISSN : 1344-9672
Text Language Code: jpn
Target Audience: 一般
Note (General): Carbon nanotubes (CNT) are just beginning to be used as probes for scanning probe microscope (SPM) systems because of the extreme high resolution that can be obtained. But processing of CNT probes have a lot of difficulties such as the need of using large equipments, long synthesizing time, low productivity and high price. A new quick and simple method for synthesizing CNT probes has been under study. In this research, a 'pulling method' is proposed and suitable synthesis conditions are investigated. This method utilizes viscosity and surface tension of solvent and electrophoresis between SPM probe and CNT dispersion liquid. The CNT can be attached to the apex of SPM probe by pulling-up process from CNT dispersion liquid. An etched SPM tungsten probe is pulled from multi wall carbon nanotube (MWNT) dispersion liquid with a bias voltage. The suitable conditions obtained are as follows: isopropyl alcohol is used as the solvent with CNT concentration of 0.05 mg/mL, bias voltage of 14 V and pulling rate of 14 μm/s. The processing time of one trial is within 1 minute and the success rate is about 70 %. It is also possible to prepare multi-connected CNT probe, single wall CNT probe and CNT probe for atomic force microscope. Therefore, our new method is suitable for mass production of CNT probes.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/1677
Access Restrictions: 限定公開
Periodical Title (NCID): AA11484797
https://ci.nii.ac.jp/ncid/AA11484797
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ