ショットキー放出型電子銃の電子軌道解析と収差の評価

Material type: 文書・図像類

Author: 成瀬, 貴臣ほか

Publisher: 愛知工業大学

Publication date: 2013-03-31

Material Format: Digital

Capacity, size, etc.: -

NDC: -

View All

Notes on use

Note (General)：: Electron trajectories in a Schottky emission electron gun were traced with numerical method at different positions of the extraction electrode as keep...

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

AIT Associated Repository of Academic Resources
Digital
You can check the holdings of institutions and databases with which 学術機関リポジトリデータベース（IRDB）（機関リポジトリ） is linked at the site of 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）.
AIT Associated Repository of Academic Resources

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Digital

Material Type: 文書・図像類
Title: ショットキー放出型電子銃の電子軌道解析と収差の評価
Author/Editor: 成瀬, 貴臣
飯吉, 僚
Author Heading: 成瀬, 貴臣
飯吉, 僚
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 2013-03-31
Publication Date (W3CDTF): 2013-03-31
Alternative Title: ショットキーホウシュツガタデンシジュウノデンシキドウカイセキトシュウサノヒョウカ
Numerical Analysis of Electron Trajectories in a Schottky Electron Gun:Evaluation of Aberrations at Different Positions of Extraction Electrode
Periodical title: 愛知工業大学研究報告 = Bulletin of Aichi Institute of Technology
No. or year of volume/issue: 48
Volume: 48
Pages: 227-233
ISSN (Periodical Title): ISSN : 1883-3217
Text Language Code: jpn
Target Audience: 一般
Note (General): Electron trajectories in a Schottky emission electron gun were traced with numerical method at different positions of the extraction electrode as keeping the tip field constant. The aberrations of the electric field lens were examined using a relation between the size and the divergence angle of the virtual source estimated from the minimum cross section of the asymptotes of the traced trajectories in a field-free space behind the extraction electrode. The aberrations are reduced as decreasing a distance between the cathode tip and the extraction electrode. The reduction is caused by a divergence field lens in front of the tip facet of the cathode.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/2139
Format (IMT): application/pdf
Source: http://repository.aitech.ac.jp/dspace/bitstream/11133/2139/1/%e7%b4%80%e8%a6%8148%e5%8f%b7%28P227-233%29.pdf
http://repository.aitech.ac.jp/dspace/bitstream/11133/2139/1/%e7%b4%80%e8%a6%8148%e5%8f%b7%28P227-233%29.pdf
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ