ワイドギャップ半導体の光学的特性評価

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Material Type: 文書・図像類
Title: ワイドギャップ半導体の光学的特性評価
Author/Editor: 澤木, 宣彦
岩田, 博之
出町, 雅彦
刑部, 建太郎
Author Heading: 澤木, 宣彦
岩田, 博之
出町, 雅彦
刑部, 建太郎
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 2020-11
Publication Date (W3CDTF): 2020-11
Alternative Title: ワイドギャップハンドウタイノコウガクテキトクセイヒョウカ
Periodical title: 総合技術研究所研究報告=Bulletin of Research Institute for Industrial Technology.
No. or year of volume/issue: 22
Volume: 22
Pages: 76-77
ISSN (Periodical Title): ISSN : 1344-9672
Text Language Code: jpn
Subject Heading: ワイドギャップ半導体
GaN
機械研磨
加工損傷
転位
PL
ラマン散乱
TEM
Target Audience: 一般
Note (General): identifier:http://repository.aitech.ac.jp/dspace/handle/11133/3764
Access Restrictions: 限定公開
Periodical Title (NCID): AA11484797
https://ci.nii.ac.jp/ncid/AA11484797
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ