Microelectronics reliability 55(12)(Pt.B):2015.12

Microelectronics reliability

55(12)(Pt.B):2015.12

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Material Type: 雑誌
ISSN: 0026-2714
Title: Microelectronics reliability
Volume: 55(12)(Pt.B):2015.12
Publication, Distribution, etc.: Amsterdam : Elsevier
Publication, distribution, etc. (Current/latest publisher): Oxford : Elsevier
Publication Date: 2015
Publication Date (W3CDTF): 2015
Note (Publication, distribution, etc.): Place of publication varies
Size: 27cm
Place of Publication (Country Code): GB
Text Language Code: eng
NDLC: ZN33
Note (General): Title: Microelectronics and Reliability (- 1997)
Holding library: 国立国会図書館
Call No.: Z53-E477
Replaces: 継続前
https://ndlsearch.ndl.go.jp/books/R100000002-I000000121703
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000121704
http://id.ndl.go.jp/bib/000000121704
Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
Bibliographic Record Category (NDL): 231