IEEE design & test of Computers

Volumes of this title

34(6):2017.11/12

34(5):2017.9/10

34(4):2017.7/8

34(3):2017.5/6

34(2):2017.3/4

Notes on use

Note (General)：: Title: IEEE design & test of Computers (v. 1, no. 1-v. 29, no. 6); IEEE design & test (v. 30, no. 1-)Frequency varies

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Material Type: 雑誌
ISSN: 0740-7475
2168-2356
Title: IEEE design & test of Computers
Publication, Distribution, etc.: Los Alamitos, Calif. : IEEE Computer Society
Publication, distribution, etc. (Current/latest publisher): New York : Institute of Electorical and -Electronics -Engineers
Note (Publication, distribution, etc.): Place of publication and publisher vary
Publication status: 不明
Publication frequency: BiMonthly
Extent: v.
Size: 28cm
Alternative Title: IEEE design & test
Place of Publication (Country Code): US
Text Language Code: eng
NDLC: ZM13
Note (General): Title: IEEE design & test of Computers (v. 1, no. 1-v. 29, no. 6); IEEE design & test (v. 30, no. 1-)
Frequency varies
Holding library: 国立国会図書館
Year and volume of holding: v. 1, no. 1 (Feb. 1984)- v. 34, no. 6 (Nov./Dec. 2017)
Call No.: Z54-F176
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000138853
http://id.ndl.go.jp/bib/000000138853
Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
Bibliographic Record Category (NDL): 231