High-resolution photoelectron spectroscopy studies of ultrathin Si gate oxides

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Material Type: 博士論文
Title: High-resolution photoelectron spectroscopy studies of ultrathin Si gate oxides
Author/Editor: 呉鎮浩 [著]
Author Heading: 呉, 鎮浩オ, ジンホ
Publication, Distribution, etc.: [呉鎮浩]
Publication Date: 2001
Publication Date (W3CDTF): 2001
Extent: 1冊
Alternative Title: 高分解能光電子分光法を用いた極薄Siゲート酸化膜に関する研究コウブンカイノウコウデンシブンコウホウオモチイタゴクウス Si ゲートサンカマクニカンスルケンキュウ
Degree grantor/type: 東京大学
Date Granted: 平成13年3月29日
Date Granted (W3CDTF): 2001
Dissertation Number: 甲第16137号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
Alias of Author: Oh, Jin-ho
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2002-A597
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000416434
http://id.ndl.go.jp/bib/000000416434
Bibliographic Record Category (NDL): 213