Proceedings / ATE Central Seminar/Exhibit, Electronics Test & Measurement Conference, October 25-28, 1982, O'Hare Exosition Center, Hyatt Regency O'Hare, Rosemont, IL.

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Material Type: 図書
Title: Proceedings / ATE Central Seminar/Exhibit, Electronics Test & Measurement Conference, October 25-28, 1982, O'Hare Exosition Center, Hyatt Regency O'Hare, Rosemont, IL.
Author Heading: ATE Central Seminar/Exhibit (1982 : Rosemont)
Electronics Test and Measurement Conference (1982 : Rosemont)
Publication, Distribution, etc.: New York : Morgan-Grampian Expositions Group
Publication Date: c1982.
Publication Date (W3CDTF): 1982
Extent: 1 v. (various pagings) : ill. ; 28 cm.
NDLC: M15
ND
Note (General): "Twelfth tri-annual"--Cover.
Holding library: 国立国会図書館
Call No.: M15-A2582
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003112676
http://id.ndl.go.jp/bib/000003112676
Bibliographic Record Category (NDL): 211