Stereology and quantitative metallography : a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971. (ASTM special technical publication)

Stereology and quantitative metallography : a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.

(ASTM special technical publication)

Call No. (NDL): PD31-A9
Bibliographic ID of National Diet Library: 000003123928

Material type: 図書

Author: Symposium on Stereology and Quantitative Metallography, (1971 : Atlantic City)ほか

Publisher: American Society for Testing Materials

Publication date: [1972]

Material Format: Paper

Capacity, size, etc.: 182 p. : ill. ; 24 cm.

NDC: -

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Notes on use

Note (General)：: Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Mi...

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Paper

Material Type: 図書
Title: Stereology and quantitative metallography : a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971.
Series Title: ASTM special technical publication
Title Heading: ASTM special technical publication ; 504.
Author Heading: Symposium on Stereology and Quantitative Metallography, (1971 : Atlantic City)
American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction.
American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography.
American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis.
Publication, Distribution, etc.: Philadelphia : American Society for Testing Materials
Publication Date: [1972]
Publication Date (W3CDTF): 1972
Extent: 182 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: 金属組織学. Kinzokusosikigaku.
Metallography -- Congresses.
Stereology -- Congresses.
LCC: TN689.2
DDC: 669/.95/0282
NDLC: PD31
Note (General): Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Microscopy and Microprobe Analysis of the American Society for Testing and Materials.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: PD31-A9
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003123928
http://id.ndl.go.jp/bib/000003123928
LC Control Number: 79186851 //r84
https://lccn.loc.gov/79186851
Bibliographic Record Category (NDL): 211