Logic testing and design for testability / Hideo Fujiwara. (MIT Press series in computer systems)

Logic testing and design for testability / Hideo Fujiwara.

(MIT Press series in computer systems)

Call No. (NDL): ND386-A6
Bibliographic ID of National Diet Library: 000003129723

Material type: 図書

Author: 藤原, 秀雄, 1946-

Publisher: MIT Press

Publication date: c1985.

Material Format: Paper

Capacity, size, etc.: x, 284 p. : ill. ; 24 cm.

NDC: -

Notes on use

Note (General)：: Includes index.

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Paper

Material Type: 図書
ISBN: 0262060965
Title: Logic testing and design for testability / Hideo Fujiwara.
Series Title: MIT Press series in computer systems
Author Heading: 藤原, 秀雄, 1946- フジワラ, ヒデオ, 1946- ( 00110826 )Authorities
Publication, Distribution, etc.: Cambridge, Mass. : MIT Press
Publication Date: c1985.
Publication Date (W3CDTF): 1985
Extent: x, 284 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: 電子回路. Densikairo.
Logic circuits -- Testing.
LCC: TK7868.L6
DDC: 621.3815/37
NDLC: ND386
Note (General): Includes index.
Note (Bibliography): Bibliography: p. [272]-278.
Holding library: 国立国会図書館
Call No.: ND386-A6
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003129723
http://id.ndl.go.jp/bib/000003129723
LC Control Number: 85000084
https://lccn.loc.gov/85000084
Bibliographic Record Category (NDL): 211