Selected reprints on logic design for testability / compiled by Constantin C. Timoc.

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Note (General)：: "IEEE catalog number EH0215-4.""IEEE Computer Society order number 573."

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Material Type: 図書
ISBN: 0818605731 (pbk.)
0818645733 (microfiche)
Title: Selected reprints on logic design for testability / compiled by Constantin C. Timoc.
Author Heading: Timoc, Constantin C.
Publication, Distribution, etc.: Silver Spring, MD : IEEE Computer Society Press
Los Angeles, CA : Order from IEEE Computer Society
Publication Date: c1984.
Publication Date (W3CDTF): 1984
Extent: viii, 315 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: 電子計算機∥演算装置. Densikeisanki∥Enzansoti.
電子回路. Densikairo.
Logic circuits -- Testing.
LCC: TK7888.4
DDC: 621.3819/5835/0287
NDLC: M164
Note (General): "IEEE catalog number EH0215-4."
"IEEE Computer Society order number 573."
Note (Bibliography): Includes bibliographies.
Holding library: 国立国会図書館
Call No.: M164-A8
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003189983
http://id.ndl.go.jp/bib/000003189983
LC Control Number: 84080983 //r90
https://lccn.loc.gov/84080983
Bibliographic Record Category (NDL): 211