Experimental Modeling of Passive Films on Iron Investigation of Semiconductive Properties of Passive Films, Synthetic Iro Oxides and Hydroxides in Combination with a New Light Reflectance Technique (ETH Diss. ; Nr. 12504)

Experimental Modeling of Passive Films on Iron Investigation of Semiconductive Properties of Passive Films, Synthetic Iro Oxides and Hydroxides in Combination with a New Light Reflectance Technique

(ETH Diss. ; Nr. 12504)

Call No. (NDL): LS-DISE-12504
Bibliographic ID of National Diet Library: 000003439057

Material type: 博士論文

Author: MARKUS BÜCHLER.

Publisher: Eidgenössische Technische Hochschule Zürich

Publication date: 1998.

Material Format: Microform

Capacity, size, etc.: 2 Microfiches ( 162 fr.) : negative, ill.

Name of awarding university/degree: Eidgenössische Technische Hochschule Zürich

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Notes on use

Note (General)：: Swiss Federal Institute of Technology.

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Microform

Material Type: 博士論文
Title: Experimental Modeling of Passive Films on Iron Investigation of Semiconductive Properties of Passive Films, Synthetic Iro Oxides and Hydroxides in Combination with a New Light Reflectance Technique
Author/Editor: MARKUS BÜCHLER.
Series Title: ETH Diss. ; Nr. 12504
Author Heading: Büchler, Markus.
Publication, Distribution, etc.: Zürich : Eidgenössische Technische Hochschule Zürich
Publication Date: 1998.
Extent: 2 Microfiches ( 162 fr.) : negative, ill.
Degree grantor/type: Eidgenössische Technische Hochschule Zürich
Date Granted: 1998.
Date Granted (W3CDTF): 1998
Note (Dissertation): 博士論文
Thesis (doctoral) --Eidgenössische Technische Hochschule Zürich, 1998.
Place of Publication (Country Code): CH
Text Language Code: eng
Note (Material Type): [microform]
Note (General): Swiss Federal Institute of Technology.
Note (Bibliography): Includes bibliographies.
Summary in German and English.
Holding library: 国立国会図書館
Call No.: LS-DISE-12504
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003439057
http://id.ndl.go.jp/bib/000003439057
Bibliographic Record Category (NDL): 216