Methods to Measure and Modify Electrical Properties on a Nanometer Scale and their Applications in Science and Technology (ETH Diss. ; Nr. 13016)

Methods to Measure and Modify Electrical Properties on a Nanometer Scale and their Applications in Science and Technology

(ETH Diss. ; Nr. 13016)

Name of awarding university/degree: Eidgenössische Technische Hochschule Zürich

Notes on use

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 博士論文
Title: Methods to Measure and Modify Electrical Properties on a Nanometer Scale and their Applications in Science and Technology
Author/Editor: Heinrich Otto Heiko Jacobs.
Series Title: ETH Diss. ; Nr. 13016
Author Heading: Jacobs, Heinrich Otto Heiko.
Publication, Distribution, etc.: Zürich : Eidgenössische Technische Hochschule Zürich
Publication Date: 1999.
Extent: 2 Microfiches ( 112 fr.) : negative, ill.
Degree grantor/type: Eidgenössische Technische Hochschule Zürich
Date Granted: 1999.
Date Granted (W3CDTF): 1999
Note (Dissertation): 博士論文
Thesis (doctoral) --Eidgenössische Technische Hochschule Zürich, 1999.
Place of Publication (Country Code): CH
Text Language Code: eng
Note (Material Type): [microform]
Note (General): Swiss Federal Institute of Technology.
Note (Bibliography): Includes bibliographies.
Summary in German and English.
Holding library: 国立国会図書館
Call No.: LS-DISE-13016
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003439733
http://id.ndl.go.jp/bib/000003439733
Bibliographic Record Category (NDL): 216