The Pion Beta Decay Experiment and A Remeasurement of the Panofsky Ratio (ETH Diss. ; Nr. 13105)

The Pion Beta Decay Experiment and A Remeasurement of the Panofsky Ratio

(ETH Diss. ; Nr. 13105)

Name of awarding university/degree: Eidgenössische Technische Hochschule Zürich

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Material Type: 博士論文
Title: The Pion Beta Decay Experiment and A Remeasurement of the Panofsky Ratio
Author/Editor: Thomas Flügel.
Series Title: ETH Diss. ; Nr. 13105
Author Heading: Flügel, Thomas.
Publication, Distribution, etc.: Zürich : Eidgenössische Technische Hochschule Zürich
Publication Date: 1999.
Extent: 1 Microfiche ( 98 fr.) : negative, ill.
Degree grantor/type: Eidgenössische Technische Hochschule Zürich
Date Granted: 1999.
Date Granted (W3CDTF): 1999
Note (Dissertation): 博士論文
Thesis (doctoral) --Eidgenössische Technische Hochschule Zürich, 1999.
Place of Publication (Country Code): CH
Text Language Code: eng
Note (Material Type): [microform]
Note (General): Swiss Federal Institute of Technology.
Note (Bibliography): Includes bibliographies.
Summary in German and English.
Holding library: 国立国会図書館
Call No.: LS-DISE-13105
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003439772
http://id.ndl.go.jp/bib/000003439772
Bibliographic Record Category (NDL): 216