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博士論文

New Methodologies for Interconnect Reliability Assessments of Integrated Circuits

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New Methodologies for Interconnect Reliability Assessments of Integrated Circuits

Call No. (NDL)
LS-DIMIT-00-118
Bibliographic ID of National Diet Library
000003447234
Material type
博士論文
Author
STEFAN P. HAU-RIEGE.
Publisher
Massachusetts Institute of Technology
Publication date
2000.
Material Format
Microform
Capacity, size, etc.
3 Microfiches ( 255 fr.) : negative, ill.
Name of awarding university/degree
Massachusetts Institute of Technology
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Microform

Material Type
博士論文
Author/Editor
STEFAN P. HAU-RIEGE.
Author Heading
Publication Date
2000.
Extent
3 Microfiches ( 255 fr.) : negative, ill.
Degree grantor/type
Massachusetts Institute of Technology
Date Granted
2000.
Date Granted (W3CDTF)
2000