Records of the 2000 IEEE international workshop on memory technology, design and testing : Aug 2000, San Jose, CA.

• Material Type: 図書
• ISBN: 0769506895 (pbk); 0769506917 (microfiche); 0769506909 (cased)
• ISSN: 1087-4852
• Title: Records of the 2000 IEEE international workshop on memory technology, design and testing : Aug 2000, San Jose, CA.
• Author Heading: IEEE. Computer Society. Technical Committee on VLSI.; IEEE. Computer Society. Technical Council on Test Technology.
• Extent: v.
• Alternative Title: Also known as MTDT 2000; memory technology ; MTDT ; IEEE
• NDLC: M17
• Note (General): Papers.; Also known as MTDT 2000.; Index term: memory technology ; MTDT ; IEEE.; BL shelfmark: 4552.1945 2000.
• Holding library: 国立国会図書館
• Call No.: M17-00-2029
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000003448594; http://id.ndl.go.jp/bib/000003448594
• UKMARC No.: G07049435
• Bibliographic Record Category (NDL): 215