Optical measurement and nondestructive testing : techniques and applications : Conference : Nov 2000, Beijing, China. (SPIE Proceedings ; 4221)

Optical measurement and nondestructive testing : techniques and applications : Conference : Nov 2000, Beijing, China.

(SPIE Proceedings ; 4221)

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Note (General)：: Papers.Index term: SPIE ; optical measurement ; nondestructive testing.

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Material Type: 図書
ISBN: 0819438928
ISSN: 0277-786X
Title: Optical measurement and nondestructive testing : techniques and applications : Conference : Nov 2000, Beijing, China.
Series Title: SPIE Proceedings ; 4221
Author Heading: SPIE.
China Optics & Optoelectronic Manufacturer's Association (COEMA)
Chinese Physical Society (CPS)
Extent: v.
Alternative Title: SPIE ; optical measurement ; nondestructive testing
NDLC: M17
Note (General): Papers.
Index term: SPIE ; optical measurement ; nondestructive testing.
Holding library: 国立国会図書館
Call No.: M17-01-1398
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003449878
http://id.ndl.go.jp/bib/000003449878
Bibliographic Record Category (NDL): 215