Test, assembly and packaging (TAP) vision conference : Jul 1999, San Jose, CA.

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Note (General)：: Papers and presentations.Held as part of SEMICON West 99.Index term: test vision ; SEMICON West ; semiconductor equipment ; TAP vision ; assembly ; pa...

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Material Type: 図書
ISBN: 189256839X (pbk)
Title: Test, assembly and packaging (TAP) vision conference : Jul 1999, San Jose, CA.
Author Heading: Semiconductor Equipment and Materials International.
Publication, Distribution, etc.: Semiconductor Equipment and Materials International
Publication Date: 1999.
Publication Date (W3CDTF): 1999
Extent: v.
Alternative Title: Held as part of SEMICON West 99
test vision ; SEMICON West ; semiconductor equipment ; TAP vision ; assembly ; packaging
NDLC: M17
Note (General): Papers and presentations.
Held as part of SEMICON West 99.
Index term: test vision ; SEMICON West ; semiconductor equipment ; TAP vision ; assembly ; packaging.
BL shelfmark: 8238.654 1999.
Holding library: 国立国会図書館
Call No.: M17-01-2345
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003451122
http://id.ndl.go.jp/bib/000003451122
UKMARC No.: G06013385
Bibliographic Record Category (NDL): 215