X-ray calibration : Techniques, sources, and detectors : Meeting : AUG 1986, San Diego, CA. (SPIE Proceedings ; 689)

X-ray calibration : Techniques, sources, and detectors : Meeting : AUG 1986, San Diego, CA.

(SPIE Proceedings ; 689)

Notes on use

Note (General)：: Papers.Index term: X-RAY CALIBRATION ; SPIE.BL shelfmark: 6823.100 vol 689 1986.

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Material Type: 図書
ISBN: 0892527242
Title: X-ray calibration : Techniques, sources, and detectors : Meeting : AUG 1986, San Diego, CA.
Series Title: SPIE Proceedings ; 689
Author Heading: SPIE.
University of Rochester. Institute of Optics.
California Institute of Technology.
Extent: v.
Alternative Title: X-RAY CALIBRATION ; SPIE
NDLC: M17
M215
Note (General): Papers.
Index term: X-RAY CALIBRATION ; SPIE.
BL shelfmark: 6823.100 vol 689 1986.
Holding library: 国立国会図書館
Call No.: M17-86-2573
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003466636
http://id.ndl.go.jp/bib/000003466636
UKMARC No.: c8651362c
Bibliographic Record Category (NDL): 215