Jump to main content

図書

Interferometric metrology : Conference : 31st Annual international technical symposium on optical and optoelectronic applied science and engineering : Aug 1987, San Diego, CA. (SPIE Proceedings ; 816)

Icons representing 図書

Interferometric metrology : Conference : 31st Annual international technical symposium on optical and optoelectronic applied science and engineering : Aug 1987, San Diego, CA.

(SPIE Proceedings ; 816)

Call No. (NDL)
M17-88-0932
Bibliographic ID of National Diet Library
000003471400
Material type
図書
Author
Society of Photo-Optical Instrumentation Engineers.
Publisher
SPIE--The International Society for Optical Engineering
Publication date
c1988.
Material Format
Paper
Capacity, size, etc.
v.
NDC
-
View All

Notes on use

Note (General)：

Papers.Critical reviews of optical science and technology.Index term: interferometric metrology ; SPIE....

Search by Bookstore

Search by Bookstore

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
0892528516 (pbk)
Title
Interferometric metrology : Conference : 31st Annual international technical symposium on optical and optoelectronic applied science and engineering : Aug 1987, San Diego, CA.
Series Title
SPIE Proceedings ; 816
Author Heading
Society of Photo-Optical Instrumentation Engineers.
Publication, Distribution, etc.
SPIE--The International Society for Optical Engineering
Publication Date
c1988.
Publication Date (W3CDTF)
1988
Extent
v.
Alternative Title
Critical reviews of optical science and technology
interferometric metrology ; SPIE