Innovations in test : ATE and instrumentation conference west : Jan 1989, Anaheim, CA.

Notes on use

Note (General)：: Papers.Index term: test ; ATE ; instrumentation ; electronics test.BL shelfmark: 8796.32742 1989.

Search by Bookstore

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 0879302127
Title: Innovations in test : ATE and instrumentation conference west : Jan 1989, Anaheim, CA.
Author Heading: Electronics Test Magazine.
Circuits Manufacturing Magazine.
EOS/ESD Technology Magazine.
Publication, Distribution, etc.: Boston : MG Expositions Group
Publication Date: 1989.
Publication Date (W3CDTF): 1989
Extent: v.
Alternative Title: test ; ATE ; instrumentation ; electronics test
NDLC: M17
M191
Note (General): Papers.
Index term: test ; ATE ; instrumentation ; electronics test.
BL shelfmark: 8796.32742 1989.
Holding library: 国立国会図書館
Call No.: M17-90-0514
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003477963
http://id.ndl.go.jp/bib/000003477963
UKMARC No.: G01291209
Bibliographic Record Category (NDL): 215